Resolve High-Resolution Image from Low-Dose Data Acquisition
蘇家平1*, 陳健群1
1Department of Physics, National Sun Yat-sen University, Kaohsiung, Taiwan
* presenting author:chia-ping Su, email:suchiaping0504@gmail.com
Observing atomic structures by scanning transmission electron microscope (STEM) has been widely applied to materials and condensed matter sciences. To achieve high-resolution image, performing longer data acquisition is usually required. However, when the exposure time gets longer, drift would generate artefacts in collected images and radiation damage is occurred as well. Here, we have developed a novel algorithm that significantly reduces both time and dose during data acquisition. Combining low-magnification image with quick-acquisition image at high-magnification, we are able to reveal much better atomic distribution and grain boundaries with much shorter exposure time.


Keywords: Scanning Transmission Electron Microscope, Higher-Resolution Image, Low-Dose Data Acquisition